Research

Projects

Ongoing

  1. Bayesian Inference for Accelerated Wear-Out Testing: Application of modern computational techniques towards reducing predictive uncertainty when qualifying modern semiconductor products.
  2. ML Wear-Out Estimation: Application of machine learning methods to predict semiconductor device aging.
  3. Reliability Sensor Monitoring Platform: Analog and digital sensors designed on a 12nm FinFET process on a platform to study and characterize reliability.

Completed (recently)

  1. Accelerated Aging Forecasting Methodology: Academic model to forecast accelerated aging model data. Public repository available.
  2. FPGA Accelerated Aging: Measured accelerated aging effects on Ring Oscillators using a 28nm FPGA platform.
  3. Gerabaldi Simulator: Temporal simulator for probabilistic degradation and failure processes with a focus on integrated circuit wear-out reliability. Public repository available.
  4. In-House HTOL Test Platform: Created a low-cost low-area solution to emulate HTOL Test conditions for reliability.

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