About Professor Ivanov

 

Biography

André Ivanov is Professor of Electrical and Computer Engineering at UBC.  He has published widely on many research topics related to the design and test of VLSI circuits and Systems on Chips (SoCs) and is an inventor of several patents. Dr. Ivanov served as Head of the Department of ECE from 2008 to 2018 where he led the department in reshaping its curriculum to meet student and industry needs and interests. The reformed curriculum focuses on learning activities that maximize student performance and experience.  The curriculum includes several points of active engagement with industry or other community partners. Dr. Ivanov has also led the department into new outreach and community-building activities, as well as industry partnership developments and renewals, including initiatives that use the UBC campus as a “living lab”. Dr. Ivanov has continuously served on the UBC Senate and its many standing committees since 2008, including serving as Chair of the Senate Teaching and Learning Committee for 6 years.

Over the years, Dr. Ivanov has served on steering, program, and/or organization committees of several international events sponsored by the IEEE or the ACM. He chaired the IEEE Computer Society Test Technology Council (TTTC) for the term 2004-2007. He has served on the Board of Governors of the IEEE Computer Society and the Board of Governors of the IEEE Technology Management Council. He was the Technical Program Chair of the VLSI Test Symposium (VTS) in 2001 and 2002 and the General Chair of VTS in 2003 and 2004.  He has served as Associate Editor for the IEEE Transactions on CAD, the IEEE Design and Test of Computers Magazine, and the Journal

of Electronic Test: Theory and Applications (JETTA). He served as Editor in Chief of IEEE Design and Test from 2012 to 2016. In 2008, he chaired the IEEE Computer Society Fellows Committee. In 2023 he was appointed to serve as co-editor-in-chief for the Elsevier Journal Microelectronics Reliability.

Dr. Ivanov is a Golden Core Member of the Computer Society, a Fellow of the IEEE (FIEEE), a Fellow of the Canadian Academy of Engineering (FCAE), a Fellow of the Engineering Institute of Canada (FEIC), and a Professional Engineer of British Columbia (PEng). Over the years, Dr. Ivanov has consulted for different multinational semiconductor companies and various governmental agencies around the world.

In 2001, Dr. Ivanov co-founded Vector 12, a semiconductor IP company. In 1995/96, he spent a sabbatical at PMC-Sierra and has held invited professor positions at the University of Montpellier II, the University of Bordeaux I, and Edith Cowan University, Perth, Australia.

Dr. Ivanov’s current research interests are focused on new solutions and methodologies aimed at addressing reliability and aging issues arising in nanoscale semiconductor devices and systems on chip (SoCs).    These methodologies fall under the broader umbrella of silicon lifecycle management (SLM). These methodologies include the development of novel sensors and monitors designed on modern FinFET technology nodes to study and characterize transistor reliability. Dr. Ivanov and his group are also working on the development of novel probabilistic programming approaches to design reliability test methodologies.  In addition, Dr. Ivanov and his group are also pursuing research in machine learning applications for electronic design automation (EDA) and for addressing semiconductor aging and reliability.


Research Interests

Silicon Lifecycle management (SLM), VLSI design and test, design for testability, IC reliability, design for reliability, semiconductor aging, fault tolerance, fault modeling and simulation, test generation, built-in self-test, built-in current testing, infrastructure IP for systems on chip, systems on chip design and test, analog and mixed-signal design and test, networks on chip, fault diagnosis, design validation, post-silicon debug.


Research Areas

  • Computer and Software Systems
  • Emerging Micro/Nano Technologies

Teaching

  • ELEC 491: Undergraduate Capstone Design Project
  • EECE 571I: Testing & Reliability of Integrated Circuits